Curriculum Vitae

Michael D. Thomas
Spica Technologies Inc.

Michael Thomas received a B.S. Degree in Optical Engineering from the University of Rochester in 1983. As an Undergraduate Mr. Thomas acquired experience at the University of Rochester Laboratory for Laser Energetics building a high power, glass laser based, damage tests station which operated at the fundamental, second harmonic and third harmonic wavelengths.

Upon leaving Rochester, Mr. Thomas joined Sanders Associates of Nashua NH where he was involved in solid state laser design, solid state laser research, and thin film design. His duties included development and characterization of various fluoride laser materials including Nd:YLF, Ho:YLF, and Ho:Er:Tm:YLF. Mr. Thomas was also involved with novel applications of the tunable Co2+:MgF2 laser and scaling this laser to high average and peak powers.

Mr. Thomas has been president of Spica Technologies since the company was founded in 1990 and is currently involved in Laser Damage Testing and performance of precision optical measurements.

Publications :

"Correlation of Test Data From Some NIF Small Optical Components," Robert Chow, Michael S. McBurney, William K. Eickelberg, Wade H. Williams, Michael D. Thomas SPIE Optical Testing and Manufacturing IV 12/2001

"Comparison of Antireflective Coated and Uncoated Surfaces Figured by Pitch-Polishing and Magnetorheological Processes." Robert Chow, Michael D. Thomas, Robert C. Bickel, John R. Taylor Laser-Induced Damage in Optical Materials:2002 and 7th International Workshop on Laser Beam and Optics Characterization .

"Laser Damage Testing Boosts Quality At All Levels," Michael D. Thomas, Photonics Spectra vol.25, Issue 11, Nov. 1991, pp.109-112

"Gain and Parasitic Suppression in Nd:YLF, "G.A> Rines, M.D. Thomas, M.G. Knights, E.P. Chicklis, Conference of Lasers and Electro-Optics 1984

"Non-Linear Conversion of 1.3 Ám Nd:YLF Emission," H.H. Zenzie, M.D. Thomas, C. Carey, E.P. Chicklis, M.G. Knights, G.A. Rines, Topical Meeting on Tunable Solid State Lasers, 1986.

"High Power 1.3 Micron Nd:YAG Laser," M. D. Thomas, E.P. Chicklis, G.A. Rines, W. Koechner, Conference on Lasers and Electro-Optics, 1986

"Very High Gain Nd:YLF Amplifiers," M.G. Knights, M.D. Thomas, E.P. Chicklis, G.A. Rines, W.Seka, IEEE J. Quantum Electronics, Vol. QE-24, pp. 712-715, 1988

"Tm:YLF Laser Operation at 2.31 Microns," M.D. Thomas, H.H. Zenzie, J.C. McCarthy, E.P. Chicklis, Conference on Lasers and Electro Optics, 1987

"Characterization of Some Sol-Gel Materials," W. Fay, G. Mizell, M.D. Thomas, Digest of Technical Papers SPIE Growth Characterization and Application of Laser Hosts and Non-Linear Materials.

"Holmium Laser Technology," M.G. Knights, E.P. Chicklis, Workshop on 3 to 5 Micron Sources, ARE, Portsdown, U.K. June 1989