Optical Metrology

Spica Technologies maintains various systems for the evaluation of optical surface characteristics

Nomarski (DIC) microscopy is an excellent method for clear observation of details including sleeks, scratches, pits, pores, and polishing marks in optical surfaces. With magnification up to 500x small surface defects are easily observed. The microscope is also equipped to record images for future evaluation.

RMS Surface Roughness and surface height evaluation services are available using a WYKO RST Plus phase measuring interferometer. This system is capable of measuring surface roughness down to 3Å RMS and can accurately measure surface and step heights in the 1nm range. In addition, this system can measure radius of curvature on extremely small samples. The RST Plus is also configured to measure roughness and surface features on bare single mode fiber, and on single mode connector surfaces.

Spica Technologies also provides custom test procedures for the evaluation of optical components. These tests have included optical scatter measurements, measurement of crystalline axis, gray track measurements in KTP, laser induced absorption measurements, and detector response characterization.